Custom designed system applies Industry 4.0 concepts to minimize downtime and cost of ownership while improving automation, quality, and yield in semiconductor testing operations Combines advanced ...
TOKYO, Dec. 11, 2020 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced that cumulative shipments of the company's T6391 display driver ...
SAN JOSE–KLA-Tencor Corp. here and Boston-based Teradyne Inc. today announced plans to integrate e-diagnostics technology into new IC-test systems so that field and factory engineers can provide ...
During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...
Based on a new NPower open architecture and XTOS (eXtendable Test Operating System) software, the Sapphire NP automated test equipment (ATE) reduces cost by being ...
If the IC-test systems run approximately 80% of the time, the test-time savings would eliminate the need for two systems, each of which probably costs $3 million or more. As these examples show, time ...
The pool of companies will compete for task orders to provide computer-controlled diagnostic equipment to test military aircraft and weapons systems. Thirty-three companies won spots on a $980 million ...
Developing test systems for R&D through production requires a combination of preparedness and ongoing evaluation. In order to carry out these tasks, the required systems must be capable of performing ...
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